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Enhanced Detection Efficiency of Direct Conversion X-ray Detector Using Polyimide as Hole-Blocking Layer

机译:使用聚酰亚胺作为空穴阻挡层的直接转换X射线探测器的增强的探测效率

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摘要

In this article we demonstrate the performance of a direct conversion amorphous selenium (a-Se) X-ray detector using biphenyldisnhydride/1,4 phenylenediamine (BPDA/PPD) polyimide (PI) as a hole-blocking layer. The use of a PI layer with a-Se allows detector operation at high electric fields (≥10 V/μm) while maintaining low dark current, without deterioration of transient performance. The hole mobility of the PI/a-Se device is measured by the time-of-flight method at different electric fields to investigate the effect of the PI layer on detector performance. It was found that hole mobility as high as 0.75 cm2/Vs is achievable by increasing the electric field in the PI/a-Se device structure. Avalanche multiplication is also shown to be achievable when using PI as a blocking layer. Increasing the electric field within a-Se reduces the X-ray ionization energy, increases hole mobility, and improves the dynamic range and sensitivity of the detector.
机译:在本文中,我们演示了使用联苯二氢/ 1,4苯二胺(BPDA / PPD)聚酰亚胺(PI)作为空穴阻挡层的直接转换非晶硒(a-Se)X射线检测器的性能。使用具有a-Se的PI层可以使检测器在高电场(≥10V /μm)下工作,同时保持低暗电流,而不会降低瞬态性能。通过飞行时间方法在不同电场下测量PI / a-Se器件的空穴迁移率,以研究PI层对检测器性能的影响。发现通过增加PI / a-Se器件结构中的电场可以实现高达0.75 cm 2 / Vs的空穴迁移率。当使用PI作为阻塞层时,也可以实现雪崩乘法。增加a-Se中的电场会降低X射线电离能,增加空穴迁移率,并改善检测器的动态范围和灵敏度。

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