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Energy barriers at grain boundaries dominate charge carrier transport in an electron-conductive organic semiconductor

机译:晶界处的能垒主导着电子导电有机半导体中的载流子传输

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摘要

Semiconducting organic films that are at the heart of light-emitting diodes, solar cells and transistors frequently contain a large number of morphological defects, most prominently at the interconnects between crystalline regions. These grain boundaries can dominate the overall (opto-)electronic properties of the entire device and their exact morphological and energetic nature is still under current debate. Here, we explore in detail the energetics at the grain boundaries of a novel electron conductive perylene diimide thin film. Via a combination of temperature dependent charge transport measurements and ab-initio simulations at atomistic resolution, we identify that energetic barriers at grain boundaries dominate charge transport in our system. This novel aspect of physics at the grain boundary is distinct from previously identified grain-boundary defects that had been explained by trapping of charges. We furthermore derive molecular design criteria to suppress such energetic barriers at grain boundaries in future, more efficient organic semiconductors.
机译:处于发光二极管,太阳能电池和晶体管核心的半导体有机薄膜通常包含大量的形态缺陷,最明显的是在晶体区域之间的互连处。这些晶界可以控制整个器件的整体(光电)电子特性,其确切的形态和能量性质仍在当前争论中。在这里,我们详细探索新型电子导电conductive二酰亚胺薄膜的晶界处的能量。通过结合温度相关的电荷传输测量和原子分辨率的从头算起的模拟,我们确定了晶界处的高能垒主导了我们系统中的电荷传输。晶界上物理学的这一新颖方面与先前确定的晶界缺陷不同,后者已通过捕获电荷来解释。我们进一步推导了分子设计标准,以抑制未来更高效的有机半导体在晶界处的此类高能垒。

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