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Measurement of persistence in YAG:Ce3+ scintillator with pulsed synchrotron X-rays

机译:用脉冲同步加速器X射线测量YAG:Ce3 +闪烁体中的余辉

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摘要

The decay time of YAG:Ce3+ phosphor was studied using a CMOS camera with a frame rate of 1302000 s−1 and pulsed X-rays from SPring-8. A high-resolution X-ray detector with YAG:Ce3+ was used with the camera to view the focused beam from the helical undulator. Mismatch between the ring circulation time and the frame time gave rise to a periodic variation of beam intensity in successive frames. Analysis of data obtained with two bunch modes showed that the decay time of YAG:Ce3+ was 60 ns. The variation of the beam positions in isolated bunches was small enough to be neglected in experiments using the focused beam. The results also show the possibility of an X-ray diffraction study at high time and space resolution.
机译:利用帧速率为1302000 s -1 的CMOS相机和SPring-8的脉冲X射线研究了YAG:Ce 3 + 荧光粉的衰减时间。带有YAG:Ce 3 + 的高分辨率X射线探测器与相机一起使用,以查看来自螺旋形波荡器的聚焦光束。环循环时间和帧时间之间的不匹配导致连续帧中光束强度的周期性变化。对两种束模式的数据分析表明,YAG:Ce 3 + 的衰减时间为60 ns。隔离束中光束位置的变化小到足以在使用聚焦光束的实验中忽略不计。结果还显示了在高时空分辨率下进行X射线衍射研究的可能性。

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