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Certification of NIST Room Temperature Low-Energy and High-Energy Charpy Verification Specimens

机译:NIST室温低能耗和高能耗夏比验证样品的认证

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摘要

The possibility for NIST to certify Charpy reference specimens for testing at room temperature (21 °C ± 1 °C) instead of −40 °C was investigated by performing 130 room-temperature tests from five low-energy and four high-energy lots of steel on the three master Charpy machines located in Boulder, CO. The statistical analyses performed show that in most cases the variability of results (i.e., the experimental scatter) is reduced when testing at room temperature. For eight out of the nine lots considered, the observed variability was lower at 21 °C than at −40 °C. The results of this study will allow NIST to satisfy requests for room-temperature Charpy verification specimens that have been received from customers for several years: testing at 21 °C removes from the verification process the operator’s skill in transferring the specimen in a timely fashion from the cooling bath to the impact position, and puts the focus back on the machine performance. For NIST, it also reduces the time and cost for certifying new verification lots. For one of the low-energy lots tested with a C-shaped hammer, we experienced two specimens jamming, which yielded unusually high values of absorbed energy. For both specimens, the signs of jamming were clearly visible. For all the low-energy lots investigated, jamming is slightly more likely to occur at 21 °C than at −40 °C, since at room temperature low-energy samples tend to remain in the test area after impact rather than exiting in the opposite direction of the pendulum swing. In the evaluation of a verification set, any jammed specimen should be removed from the analyses.
机译:通过对五个低能量和四个高能量批次进行130次室温测试,研究了NIST认证夏比参考样品在室温(21°C±1°C)而不是-40°C下进行测试的可能性。在位于Boulder,CO的三台主Charpy机器上使用钢。进行的统计分析表明,在大多数情况下,在室温下测试时,结果的可变性(即实验散点)减小了。对于所考虑的9个批次中的8个,在21°C时观察到的变异性低于在−40°C下的变异性。这项研究的结果将使NIST能够满足客户多年来收到的室温夏比验证标本的要求:在21°C的温度下进行测试可以消除操作员及时转移标本的技能。将冷却浴移至撞击位置,然后将重点重新放在机器性能上。对于NIST,它还减少了验证新验证批的时间和成本。对于使用C形锤测试的一组低能量批次,我们遇到了两个试样被卡住的情况,产生了异常高的吸收能值。对于两个样品,都清楚地看到了堵塞的迹象。对于所有调查的低能耗批次,在21°C发生堵塞的可能性要比在−40°C发生的可能性高一些,因为在室温下,低能耗样品在撞击后倾向于保留在测试区域中,而不是从相反的地方离开摆的方向。在评估验证集时,应从分析中去除所有卡住的样本。

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