【2h】

Interlaboratory Comparison of Magnetic Thin Film Measurements

机译:磁性薄膜测量的实验室间比较

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摘要

A potential low magnetic moment standard reference material (SRM) was studied in an interlaboratory comparison. The mean and the standard deviation of the saturation moment ms, the remanent moment mr, and the intrinsic coercivity Hc of nine samples were extracted from hysteresis-loop measurements. Samples were measured by thirteen laboratories using inductive-field loopers, vibrating-sample magnetometers, alternating-gradient force magnetometers, and superconducting quantum-interference-device magnetometers. NiFe films on Si substrates had saturation moment measurements reproduced within 5 % variation among the laboratories. The results show that a good candidate for an SRM must have a highly square hysteresis loop (mr/ms > 90 %), Hc ≈ 400 A·m−1 (5 Oe), and ms ≈ 2 × 10−7 A·m2 (2 × 10−4 emu).
机译:在实验室间的比较中研究了一种潜在的低磁矩标准参考材料(SRM)。从磁滞回线测量中提取了9个样品的饱和力矩ms,剩余力矩mr和固有矫顽力Hc的平均值和标准偏差。样品在13个实验室中使用感应场弯管器,振动样品磁力仪,交变梯度力磁力仪和超导量子干涉仪磁力仪进行了测量。在硅衬底上的NiFe膜的饱和力矩测量值在实验室之间的变化在5%之内。结果表明,良好的SRM候选者必须具有高度方形的磁滞回线(mr / ms> 90%),Hc≈400 A·m -1 (5 Oe)和ms≈2 ×10 −7 A·m 2 (2×10 −4 emu)。

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