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Quantitative Evaluation of Contamination on Dental Zirconia Ceramic by Silicone Disclosing Agents after Different Cleaning Procedures

机译:经过不同清洗程序后有机硅显露剂对牙科氧化锆陶瓷污染的定量评估

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摘要

The aim of this study was to evaluate the effectiveness of cleaning procedures for air-abraded zirconia after contamination with two silicone disclosing agents. Air-abraded zirconia ceramic specimens (IPS e.max ZirCAD) were contaminated with either GC Fit Checker white or GC Fit Checker II. Untreated zirconia specimens were used as control. Afterwards the surfaces were cleaned either with waterspray or ultrasonically in 99% isopropanol or using a newly developed cleaning paste (Ivoclean). After cleaning X-ray photoelectron spectroscopy (XPS) was performed and the relative peak intensities of Zr, C and Si were used for a qualitative comparison of the residuals. There was no significant difference between the two different silicone disclosing agents. An additional cleaning step with isopropanol led to a significantly lower amount of residuals on the surface, but an additional cleaning process with Ivoclean did not reduce the amount of carbon residuals in comparison to the isopropanol cleaning. Just the silicone amount on the surface was reduced. None of the investigated cleaning processes removed all residuals from the contaminated surface. Standard cleaning processes do not remove all residuals of the silicone disclosing agent from the surface. This may lead to a failure of the resin-ceramic bonding.
机译:这项研究的目的是评估两种有机硅揭露剂污染后的空气氧化锆清洁程序的有效性。空气研磨的氧化锆陶瓷样品(IPS e.max ZirCAD)被GC Fit Checker白色或GC Fit Checker II污染。未经处理的氧化锆样品用作对照。然后,使用喷水或在99%异丙醇中超声清洗表面,或使用新开发的清洗膏(Ivoclean)清洗表面。清洗后,进行X射线光电子能谱(XPS),并将Zr,C和Si的相对峰强度用于残留物的定性比较。两种不同的有机硅显示剂之间没有显着差异。与异丙醇清洁相比,使用异丙醇进行的附加清洁步骤会导致表面上残留物的数量明显减少,但是使用Ivoclean进行附加清洁过程并不会减少碳残留量。仅减少了表面上的硅酮量。所研究的清洁工艺均未从受污染的表面清除所有残留物。标准的清洁工艺不能从表面去除硅树脂显示剂的所有残留物。这可能导致树脂-陶瓷结合失败。

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