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Formation of Indium-Doped Zinc Oxide Thin Films Using Ultrasonic Spray Pyrolysis: The Importance of the Water Content in the Aerosol Solution and the Substrate Temperature for Enhancing Electrical Transport

机译:超声喷雾热解法形成铟掺杂氧化锌薄膜的研究:气溶胶溶液中水分的含量和基质温度对提高电迁移的重要性

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摘要

Indium doped zinc oxide [ZnO:In] thin films have been deposited at 430°C on soda-lime glass substrates by the chemical spray technique, starting from zinc acetate and indium acetate. Pulverization of the solution was done by ultrasonic excitation. The variations in the electrical, structural, optical, and morphological characteristics of ZnO:In thin films, as a function of both the water content in the starting solution and the substrate temperature, were studied. The electrical resistivity of ZnO:In thin films is not significantly affected with the increase in the water content, up to 200 mL/L; further increase in water content causes an increase in the resistivity of the films. All films show a polycrystalline character, fitting well with the hexagonal ZnO wurtzite-type structure. No preferential growth in samples deposited with the lowest water content was observed, whereas an increase in water content gave rise to a (002) growth. The surface morphology of the films shows a consistency with structure results, as non-geometrical shaped round grains were observed in the case of films deposited with the lowest water content, whereas hexagonal slices, with a wide size distribution were observed in the other cases. In addition, films deposited with the highest water content show a narrow size distribution.
机译:铟掺杂的氧化锌[ZnO:In]薄膜已通过化学喷雾技术在430°C的条件下从乙酸锌和乙酸铟开始沉积在钠钙玻璃基板上。通过超声激发完成溶液的粉碎。研究了薄膜中ZnO的电学,结构,光学和形态学特性随起始溶液中水含量和底物温度的变​​化。 ZnO的电阻率:随着水分含量的增加(至多200 mL / L),薄膜中的ZnO的电阻率不受明显影响;含水量的进一步增加导致膜的电阻率增加。所有薄膜均显示出多晶特性,非常适合六角形的ZnO纤锌矿型结构。在最低含水量的样品中未观察到优先生长,而含水量的增加导致(002)生长。膜的表面形态显示出与结构结果一致,因为以最低水含量沉积的膜观察到非几何形状的圆形晶粒,而在其他情况下观察到具有宽尺寸分布的六边形切片。另外,以最高水含量沉积的膜显示出窄的尺寸分布。

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