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Nonlinear Etch Rate of Au-Assisted Chemical Etchingof Silicon

机译:金辅助化学蚀刻的非线性蚀刻速率硅

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摘要

We demonstrated time-dependent mass transport mechanisms of Au-assisted chemical etching of Si substrates. Variations in the etch rate and surface topology were correlated with catalyst features and etching duration. Nonlinear etching characteristics were associated with the formation of pinholes and whiskers. Variable rates of mass transport as a function of whisker density accounted for the nonlinear etch rates of Si. Nanopinholes on Au catalysts facilitated the vertical mass transport of reactants and byproducts, which dramatically changed the etch rate, surface topology, and porosity of Si. The suggested transport models describe the transient mass transport and the corresponding chemical reactions.
机译:我们展示了时间依赖性的Au辅助化学蚀刻Si衬底的质量传输机制。蚀刻速率和表面拓扑的变化与催化剂特征和蚀刻持续时间相关。非线性蚀刻特性与针孔和晶须的形成有关。随晶须密度变化的质量传输速率是硅的非线性刻蚀速率的原因。金催化剂上的纳米针孔促进了反应物和副产物的垂直传质,从而极大地改变了硅的蚀刻速率,表面拓扑和孔隙率。建议的传输模型描述了瞬时质量传输和相应的化学反应。

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