首页> 中文期刊> 《等离子体科学和技术:英文版》 >Study of Inner-Shell Excitation and Relaxation Processes in Atomic and Ionic Neon by Means of Soft X-Ray Spectroscopy

Study of Inner-Shell Excitation and Relaxation Processes in Atomic and Ionic Neon by Means of Soft X-Ray Spectroscopy

         

摘要

By using soft X-ray spectroscopy, we investigate the inner-shell excitation and relaxationprocesses in atomic and ionic neon targets. Resonant X-ray emission spectroscopy wasapplied to neutral neon atom in the regions of the [ls]np (n= 3,4,...,ε) excited states and[ls2p]3pmp (m= 3,4) doubly excited states to obtain the spectroscopic information on the[2p]np and [2p^2]3pmp final electronic states, where square brackets indicate hole states. The energylevels of the [2p^2]3pmp (m=3,4) electronic states were spectroscopically measured for thefirst time. As for the ionic neon target, on the other hand, the photoion yield spectroscopy wasadopted to survey the ls→np (n= 2, 3) resonant excitation and subsequent Auger decay processesfor Ne^+ target-ions. The observed Ne^(2+) photoion yield spectrum is successfully explainedby the theoretical calculations based on the multiconfiguration Dirac-Fock method.

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