A probe-hole field emission microscope system,controlled by the Apple Ⅱ computer,has been developed and operated successfully for measuring the work function of a single crystalplane.The detection screen,the phototube and the amplifier are combined for measuring theprobe-hole current.The combination is calibrated and the calibrated data are used in the com-puter program.The high voltage on the viewing screen is adjusted by using a D/A converter.The total current and the probe-hole current are acquired by using an A/D converter.A programin BASIC is used for processing all data and the Fowler-Nordheim plot parameters are given.Work functions of single crystal planes can then be calculated;as examples,the work functionson the clean W(100)and W(111)planes are measured to be 4.67 eV and 4.45 eV,respectively.
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