一种基于多目标遗传算法的高层次测试综合方法

摘要

提出一种基于多目标遗传算法的高层次测试综合方法.该方法在面积和时间的约束下,在高层次调度和单元分配过程中完成电路的可测性设计.通过约束条件的转换和新式的杂交算子来避免无效染色体的产生,改善了遗传算法中解的质量和收敛速度.实验结果表明了该方法的有效性.%A high-level test integration method based on multi-objective genetic algorithm is proposed in this paper,which completes the testable design of the circuit with the constraints of time and area during the process of high-level scheduling and functional unit allocation.Invalid chromosomes are avoided to produce through the transformation of constraint conditions and the new crossover operator,thereby the solution quality and the convergence rate in genetic algorithm are improved.The feasibility of this algorithm is demonstrated by the experimental result.