小角X射线散射在分子筛研究中的应用

摘要

As a physical technique, small angle X-ray scatter (SAXS) can be used to study the geometric structure of inhomogeneous electron density zone inside the matter at nanometer level. This review focuses on advantages and features of synchrotron radiation X-ray source SAXS, and the newly progress of its application to characterizations of sol-gel process, synthesis process and structure of zeolite, in particular, the existence behavior of silicoaluminum species in sol-gel system, the influence on synthesis of zeolite and the fractal structure, particle size, mesoporous size, morphology and interface features of zeolite. Finally, the problems existing in SAXS application to zeolite-related researches are discussed and the future research direction is proposed.%小角 X 射线散射（SAXS）是在纳米尺度范围内研究物质内部电子密度不均匀区几何结构的物理手段。着重介绍了同步辐射光源小角X射线散射技术（SAXS）优势和特点，系统地总结了SAXS技术在溶胶-凝胶过程、分子筛合成过程及分子筛表征方面的最新进展，尤其是SAXS技术研究溶胶体系中硅物种的存在行为及其对分子筛合成的影响规律，以及在研究分子筛的分形结构、粒径尺寸和介孔的分子筛孔道的大小、形貌和分子筛界面特征方面的最新进展。最后分析了SAXS在分子筛研究中存在问题并对其在该领域未来的研究方向进行了展望。