An Improvement on the Junction Temperature Measurement of Light-Emitting Diodes by using the Peak Shift Method Compared with the Forward Voltage Method

著录项

• 来源
  《中国物理快报：英文版》 |2012年第12期|215-218|共4页
• 作者

  HE Su-Ming; LUO Xiang-Dong; ZHANG Bo; FU Lei; CHENG Li-Wen; WANG Jin-Bin; LU Wei;

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• 作者单位

  Key Laboratory of Low-Dimensional Materials and Application Technology of Ministry of Education, Xiangtan University, Xiangtan 411105;

  National Lab for Infrared Physics, Shanghai Institute of Technical Physics,Chinese Academy of Sciences, Shanghai 200083;

  National Lab for Infrared Physics, Shanghai Institute of Technical Physics,Chinese Academy of Sciences, Shanghai 200083;

  National Lab for Infrared Physics, Shanghai Institute of Technical Physics,Chinese Academy of Sciences, Shanghai 200083;

  National Lab for Infrared Physics, Shanghai Institute of Technical Physics,Chinese Academy of Sciences, Shanghai 200083;

  National Lab for Infrared Physics, Shanghai Institute of Technical Physics,Chinese Academy of Sciences, Shanghai 200083;

  Key Laboratory of Low-Dimensional Materials and Application Technology of Ministry of Education, Xiangtan University, Xiangtan 411105;

  National Lab for Infrared Physics, Shanghai Institute of Technical Physics,Chinese Academy of Sciences, Shanghai 200083;

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• 正文语种 chi
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