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Effects of polarization on intersubband transitions of AlxGa1-xN/GaN multi-quantum wells

         

摘要

The effects of polarization and related structural parameters on the intersubband transitions of AlGaN/GaN multiquantum wells (MQWs) have been investigated by solving the Schr(o)dinger and the Poisson equations self-consistently.The results show that the intersubband absorption coefficient increases with increasing polarization while the transition wavelength decreases,which is not identical to the case of the interband transitions.Moreover,it suggests that the well width has a greater effect on the intersubband transitions than the barrier thickness,and the intersubband transition wavelength of the structure when doped in the barrier is shorter than that when doped in the well.It is found that the influences of the structural parameters differ for different electron subbands.The mechanisms responsible for these effects have been investigated in detail.

著录项

  • 来源
    《中国物理:英文版》 |2013年第5期|473-479|共7页
  • 作者单位

    Wuhan National Laboratory for Optoelectronics, College of Optoelectronic Science and Engineering,Huazhong University of Science and Technology, Wuhan 430074, China;

    Wuhan National Laboratory for Optoelectronics, College of Optoelectronic Science and Engineering,Huazhong University of Science and Technology, Wuhan 430074, China;

    Wuhan National Laboratory for Optoelectronics, College of Optoelectronic Science and Engineering,Huazhong University of Science and Technology, Wuhan 430074, China;

    Wuhan National Laboratory for Optoelectronics, College of Optoelectronic Science and Engineering,Huazhong University of Science and Technology, Wuhan 430074, China;

    Wuhan National Laboratory for Optoelectronics, College of Optoelectronic Science and Engineering,Huazhong University of Science and Technology, Wuhan 430074, China;

    Wuhan National Laboratory for Optoelectronics, College of Optoelectronic Science and Engineering,Huazhong University of Science and Technology, Wuhan 430074, China;

    Jiangsu Key Laboratory of ASIC Design, Nantong University, Nantong 226019, China;

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