纳米CL-20炸药含能墨水的直写规律

摘要

Aiming at the micro-detonation sequence of MEMS initiators,the direct writing characteristics of CL-20 explosive ink composed of nano CL-20 explosive,binder system (including the binder and the solvent)and other additives based on the direct writing technique were studied.Three kinds of energetic inks were prepared.The influence rule of direct writing pressure,jet diameter,direct writing height and ink viscosity on the direct writing process was analyzed.The results show that with ink viscosity increasing,the direct writing line width reduces and the reduction amplitude increases,but when the viscosity is too high,it will affects the uniformity of line width. The uneven phenomenon of line width appears at nozzle height of 0.50 mm or 0.75 mm for formula Ⅰ and nozzle height of 0.75 mm for formula Ⅲ.Formula Ⅱ with stable direct writing line width is suitable for direct writing charge.Printing line width of CL-20 ink increases significantly when the pressure in nozzle increases.With increas-ing the pressure from 100 kPa to 200 kPa,the line width increases by about 2.5 times.With increasing the inner diameter of nozzle,the direct writing line width increases obviously and the increase amplitude is more and more. The direct writing line width of ink reduces with the nozzle height increases.When direct writing line width is more than 1 285μm,air bubbles form when ink solidifies.Therefore,line width in the direct writing process should be controlled to avoid the air into the ink.%针对 MEMS引信中微传爆序列,基于直写技术,研究了由纳米CL-20 炸药、黏结剂体系(包括黏结剂和溶剂)和其他添加剂组成的CL-2 0 炸药墨水的直写特性,并制备了 3 种含能墨水.分析了直写压力、针头直径、直写高度和墨水黏度等因素对直写过程的影响规律.结果表明,随墨水黏度增大,直写线宽减小且减小幅度增大,但黏度过度偏大时,会影响直写线宽的均匀性,配方Ⅰ在喷头高度为0 .5 0 mm 和0 .7 5 mm 时,以及配方Ⅲ 在喷头高度为0 .7 5 mm时,均出现了线宽不均的现象;配方Ⅱ直写线宽稳定更适合直写装药.随着喷管压力的增大,CL-2 0油墨的打印线宽明显增加,且对于不同针头直径和不同配方墨水压力大小变化相同,线宽的增幅基本相同,当压力由100 kPa增加到200 kPa,线宽增大约2.5 倍.随着喷头内径的增大,油墨的直写线宽明显增大,且线宽增加的幅度越来越大.随着喷头高度的增大,油墨的直写线宽减小.对于直写线宽大于 1 285μm 的墨水线条,固化后墨水表面均出现气泡,直写时应控制线宽,防止在直写过程中空气进入墨水.