基于IEEE1149.7标准的CJTAG测试设计方法研究

摘要

Based on the study of the IEEE1149.7 standard, the CJTAG test controller is designed to solve the problem of chip test. The controller mainly realized the test function of IEEE 1149.7:class T0, T1, T3 and T4. The simulation results show that the test signal generated by the controller can meet the requirements of IEEE 1149.7, and can be able to achieve the appropriate test function with good prospect of application.%在深入研究IEEE1149.7标准的基础上,针对测试问题设计了CJTAG测试控制器,实现了T0、T1、T3和T4层级的主要功能.对该控制器的各个功能进行了仿真验证.结果表明该控制器产生的测试信号符合IEEE1149.7标准的规定,能够控制待测芯片实现相应的测试功能,取得了较好的测试效果.