原子力显微镜测量高分子纳米材料力学性能探针选择的研究

摘要

In this paper ,we studied the influence of the polymer single crystal thickness and the tip spring constant (k) on the test results of the mechanical measurement using the atomic force microscopy . The experiment shows that the substrate has a great influence when the sample is too thin ,and when the tip spring constant(k) is low ,the mechanical property is lower than the true value .A appropriate k can make the measure results more close to its true value .%以高分子单晶为测试样本，主要研究了利用原子力显微镜（A FM ）对高分子纳米材料进行力学性能测试时样本的厚度和探针的弹性系数（k ）对其测试结果的影响。结果表明测试的样本厚度比较低时测试结果受基底影响较大；在样本确定足够厚度的前提下，探针采用k值过小的探针得到的测试值偏低，采用合适k值的探针才能得到较接近真实值得测试结果。