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Quantum dot infrared photodetectors under the influence of proton irradiation.

机译:质子辐射影响下的量子点红外光电探测器。

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摘要

Quantum dot infrared photodetectors (QDIP) have shown promising performance in various applications such as surveillance, night vision and applications in space. QDIPs have many advantages compared to their counterpart quantum well infrared photodetectors (QWIP). The advantages of the QDIP include: (1) sensitive to normal-incidence light which simplifies the configurations for imaging systems, (2) longer lifetime of carriers because of the decreased electron-phonon scattering which lead to a high photoconductive gain (3) lower dark current because of the three dimensional confinement of the carriers which enable higher operating temperature. Recent studies have shown that the QD structures and QD-based devices are much more resistant to irradiation than bulk semiconductors or quantum wells, which make QDIPs a promising candidate for space applications.;The objective of this work is to design and fabricate quantum dot infrared photodetectors and investigate the influence of the proton irradiation on the fabricated photodetectors. The photodetectors in this work were grown by using molecular beam epitaxy (MBE) technique. The final devices were fabricated by standard processing techniques including photolithography, chemical wet etching, evaporative metal deposition, lift-off and rapid thermal annealing. The dark current of the photodetectors was measured at temperatures of 77K. The photoresponse ranging from visible and near infrared (NIR) band to middle infrared (MIR) band was observed under different temperatures and bias voltages. Then, the photoresponse and I-V characteristics of the devices were investigated as a function of proton fluences in the range of 9.0x1010 -- 5.0x1014 cm-2. The intensity of the photoresponse spectra was reduced by about two orders of magnitude after irradiating the device with a fluence of 5.0x1014 cm -2. On the other hand a partial recovery of the photoresponse is observed when the rapid thermal annealings were done on the device.
机译:量子点红外光电探测器(QDIP)在各种应用(例如监视,夜视和太空应用)中显示出令人鼓舞的性能。与同类量子阱红外光电探测器(QWIP)相比,QDIP具有许多优势。 QDIP的优点包括:(1)对法向入射光敏感,从而简化了成像系统的配置;(2)由于电子声子散射减少而导致载流子的寿命更长,从而导致高的光电导增益(3)降低了由于载流子的三维限制,从而实现了更高的工作温度,因此产生了暗电流。最近的研究表明,QD结构和基于QD的设备比大块半导体或量子阱具有更强的抗辐射能力,这使QDIP成为空间应用的有前途的候选者;该工作的目的是设计和制造量子点红外光电探测器,并研究质子辐照对制造的光电探测器的影响。这项工作中的光电探测器是通过使用分子束外延(MBE)技术生长的。最终器件通过标准工艺技术制造,包括光刻,化学湿蚀刻,金属蒸发沉积,剥离和快速热退火。在77K的温度下测量了光电探测器的暗电流。在不同的温度和偏置电压下,观察到了从可见光和近红外(NIR)波段到中红外(MIR)波段的光响应。然后,研究了器件在9.0x1010-5.0x1014 cm-2范围内作为质子注量的函数的光响应和I-V特性。在以5.0x1014 cm -2的能量密度辐照该装置后,光响应光谱的强度降低了大约两个数量级。另一方面,当在器件上进行快速热退火时,观察到光响应的部分恢复。

著录项

  • 作者

    Shao, Dali.;

  • 作者单位

    University of Arkansas.;

  • 授予单位 University of Arkansas.;
  • 学科 Engineering Electronics and Electrical.;Physics Radiation.;Engineering Nuclear.
  • 学位 M.S.
  • 年度 2010
  • 页码 51 p.
  • 总页数 51
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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