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Synthesis of superconducting thin films of magnesium diboride and lead by electroless plating on conducting and non-conducting substrates.

机译:通过在导电和非导电基材上进行化学镀来合成二硼化镁和铅的超导薄膜。

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Superconducting lead films have been synthesized using an electroless plating technique on a number of different substrates, including copper, silicon and sapphire and superconducting thin films of magnesium diboride has been synthesized on copper substrates using a novel electroless plating technique. X-ray diffraction (XRD) measurements confirm that the films are lead with lead oxide impurities, and scanning electron microscope (SEM) images show that the films prepared on copper are uniform. However, samples deposited on silicon and sapphire exhibit pronounced structural irregularities. The Pb films deposited on a copper substrate have a superconducting volume fraction of approximately 45%, while the superconducting fraction for films on silicon and sapphire is on the order of 1%. We attribute this lower superconducting fraction to the presence of lead oxide impurities and structural defects in the samples. X-ray diffraction measurements confirm that the films are crystalline MgB2 with some impurity phases, including MgB4 and Mg 2B2O5. Clear evidence for a superconducting transition in the magnetization measurements was observed.
机译:已经使用化学镀技术在包括铜,硅和蓝宝石的许多不同基板上合成了超导铅膜,并且使用新型化学镀技术在铜基板上合成了二硼化镁的超导薄膜。 X射线衍射(XRD)测量证实该膜是带有氧化铅杂质的铅,而扫描电子显微镜(SEM)图像显示在铜上制备的膜是均匀的。然而,沉积在硅和蓝宝石上的样品表现出明显的结构不规则性。沉积在铜基板上的Pb薄膜的超导体积分数约为45%,而硅和蓝宝石上的薄膜的超导体积分数约为1%。我们将此较低的超导部分归因于样品中氧化铅杂质和结构缺陷的存在。 X射线衍射测量证实该膜为具有某些杂质相的晶体MgB2,包括MgB4和Mg 2B2O5。观察到了磁化测量中超导转变的明确证据。

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