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Radio Frequency Characterization and Modelling of Low Temperature Co-Fired Ceramic (LTCC) Material and Devices.

机译:低温共烧陶瓷(LTCC)材料和设备的射频特性和建模。

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摘要

The focus of this dissertation is on the characterization of Low Temperature Co-fired Ceramic (LTCC) for microwave and Radio Frequency (RF) applications. The LTCC substrates' excellent microwave properties make them great candidates for the packaging of RF devices, as well as the fabrication of passive RF and microwave components. In order to utilize LTCC, the first step is to characterize its microwave properties including the dielectric constant and loss tangent which will enable designers to design and simulate the RF behavior of LTCC components accurately. Investigating various measurement techniques, we decided to use a parallel plate capacitor for the characterization of a LTCC substrate from 100 MHz to 1 GHz and a conductor backed coplanar waveguide from 1 GHz to 10 GHz. After fabrication of several test structures on Dupont 951 LTCC substrates, the scattering parameters were measured using a 110 GHz Vector Network Analyzer and the effect of the pads were de-embedded from measurement results. Through this process, we developed a novel fast de-embedding method which de-embeds the effect of the pads and parts of the transmission lines as opposed to the conventional method, where only the effect of the pads is removed. This will result in a similar electromagnetic field around the de-embedded structure to that of a test structure where no pad exists. Therefore, the proposed de-embedding method produces more accurate loss tangent and dielectric constant results compared to the conventional method.
机译:本文的重点是针对微波和射频(RF)应用的低温共烧陶瓷(LTCC)的表征。 LTCC基板出色的微波性能使其成为RF器件封装以及无源RF和微波组件制造的理想选择。为了利用LTCC,第一步是表征其微波特性,包括介电常数和损耗角正切,这将使设计人员能够准确地设计和模拟LTCC组件的RF特性。通过研究各种测量技术,我们决定使用平行板电容器来表征100 MHz至1 GHz的LTCC基板和1 GHz至10 GHz的背衬导体的共面波导。在Dupont 951 LTCC基板上制造几个测试结构后,使用110 GHz矢量网络分析仪测量散射参数,并从测量结果中去除焊盘的影响。通过此过程,我们开发了一种新颖的快速去嵌入方法,该方法可以消除焊盘和传输线部分的影响,这与传统方法相反,在传统方法中,仅去除了焊盘的影响。这将导致去嵌入结构周围的电磁场与不存在焊盘的测试结构相似。因此,与传统方法相比,所提出的去嵌入方法可产生更准确的损耗角正切和介电常数结果。

著录项

  • 作者

    Kalantari, Fatemeh.;

  • 作者单位

    University of Alberta (Canada).;

  • 授予单位 University of Alberta (Canada).;
  • 学科 Electrical engineering.
  • 学位 M.S.
  • 年度 2014
  • 页码 91 p.
  • 总页数 91
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 老年病学;
  • 关键词

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