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Analysis of calibration adjustment policies for electronic test equipment.

机译:分析电子测试设备的校准调整策略。

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摘要

To assure optimal performance, test equipment (TE) are calibrated and adjusted on a periodic basis. Calibration and adjustment practices, however, are not done based on a single methodical approach. Various methods are being used to adjust/renew test equipment to nominal value during calibration. Traditionally, the Navy Metrology Calibration (METCAL) policy has always been to adjust the test instrument to nominal value only when an out-of-tolerance condition is observed during calibration. Another policy that is being practiced in many Navy calibration labs today, however, is to always adjust the test instrument regardless of the calibration outcome.;In this paper, a statistical metrology method is employed to develop a baseline understanding of the adjustment methods' effectiveness using two complementary techniques: a limited physical experiment in an environmentally controlled laboratory, and a Monte Carlo simulation.
机译:为了确保最佳性能,定期对测试设备(TE)进行校准和调整。但是,校准和调整实践并非基于单一的方法方法。在校准过程中,可以使用多种方法将测试设备调整/更新为标称值。传统上,海军计量校准(METCAL)策略始终是仅在校准过程中观察到超出公差的情况时才将测试仪器调整为标称值。然而,当今许多海军校准实验室正在实施的另一项政策是,无论校准结果如何,都始终对测试仪器进行调整。;在本文中,采用统计计量方法来形成对调整方法有效性的基本了解。使用两种补充技术:在环境受控实验室中进行的有限物理实验以及蒙特卡洛模拟。

著录项

  • 作者

    Chhongvan, Ken Sakhan.;

  • 作者单位

    California State University, Dominguez Hills.;

  • 授予单位 California State University, Dominguez Hills.;
  • 学科 Engineering Electronics and Electrical.;Engineering Industrial.
  • 学位 M.S.Q.A.
  • 年度 1995
  • 页码 102 p.
  • 总页数 102
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 现代史(1917年~);
  • 关键词

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