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The physics of gaseous exposures on active field emission microcathode arrays.

机译:有源场发射微阴极阵列上气体暴露的物理学。

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The interaction of active molybdenum field emission microcathode arrays with oxygen, water, carbon dioxide, methane, hydrogen and helium gases was studied. Experiments were set up to measure the emission characteristics as a function of gas exposures. The resulting changes in the surface work function of the tips were determined from the Fowler-Nordheim plots. The kinetics of the FEA-gas interaction were studied by observing the ion species originating from the array during and after gas exposures with a high resolution quadrupole mass spectrometer. With the work function data and the mass spectrometry information, the mechanisms responsible for emission degradation and subsequent device recovery after exposures have been determined.;The data obtained was used in estimating the device lifetimes under various vacuum environments. Also it was found that the gas exposure effects are similar in dc and pulsed modes of operation of the arrays, thus permitting the use of dc mode testing as an effective acceleration method in establishing the device lifetimes under various vacuum conditions. The vacuum conditions required for the long term emission current stability and reliability of vacuum microelectronic devices employing FEAs are established.;Exposure of Mo field emitter arrays to oxygen bearing species like oxygen, water and carbon dioxide resulted in serious emission current degradation. Whereas, exposure to methane and hydrogen caused a significant increase in emission current. The control of residual gases like O
机译:研究了活性钼场发射微阴极阵列与氧气,水,二氧化碳,甲烷,氢气和氦气的相互作用。进行实验以测量排放特性随气体暴露的变化。根据Fowler-Nordheim图确定尖端的表面功函数的最终变化。通过使用高分辨率四极杆质谱仪观察气体暴露期间和之后源自阵列的离子物种,研究了FEA-气体相互作用的动力学。借助功函数数据和质谱信息,确定了造成暴露后的发射降解和随后的设备恢复的机制。所获得的数据用于估计在各种真空环境下的设备寿命。还发现在阵列的直流和脉冲操作模式下,气体暴露效果相似,因此允许使用直流模式测试作为有效的加速方法来建立各种真空条件下的器件寿命。建立了使用FEA的真空微电子器件的长期发射电流稳定性和可靠性所需的真空条件。; Mo场致发射器阵列暴露于含氧物质(如氧气,水和二氧化碳)中会导致严重的发射电流劣化。而暴露于甲烷和氢气导致发射电流显着增加。 O等残留气体的控制

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