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Controlling microstructure and mechanical properties of the new microelectronic interconnect alloys.

机译:控制新型微电子互连合金的组织和力学性能。

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摘要

An in-depth understanding of the physics of solidification could lead to the optimization of the properties of micro-electronic interconnects. Sn is the base material in the billions of interconnects in devices such as smart phones. These interconnects are formed by melting and solidifying a solder alloy (e.g. SnAgCu) in situ. But Sn has a low symmetry structure, Sn nucleation from the solder melt is complex and the morphology of the Sn and Sn alloys precipitates that form during solidification can vary tremendously (along with resultant mechanical properties). The effect of processing parameters on the solidification behavior, microstructure, and properties must be carefully addressed.;Strong evidence adduced in this study shows that under many conditions, when cooling near eutectic SnAgCu from the melt, Ag3Sn nucleates before beta-Sn. The difficulty in the nucleation of beta-Sn provides a window of time between the nucleation of Ag3Sn precipitates and of beta-Sn solidification within which the Ag3Sn precipitate morphology can be manipulated. Thus distinct variations in precipitate number density, and inter-particle spacing were observed for different thermal histories, e.g. for different cooling rates. The average number density of Ag3Sn particles and the area of the pseudo-eutectic phase were observed to increase with increase in the Ag concentration, and with increase in the cooling rate. The shear strength and shear fatigue life increased with increase in the area fraction of the pseudo-eutectic phase. Upon aging of SnAgCu solder joints at an elevated temperature, the Ag3Sn particles coarsened, and became less effective in impeding dislocation motion. Consequently, the shear strength and shear fatigue performance degraded. On the other hand, alloys with constituents that formed solid solutions in Sn, such as small concentrations of Bi or Sb registered less degradation in both shear strength and shear fatigue life upon aging.
机译:对凝固物理学的深入理解可以导致微电子互连的性能的优化。 Sn是智能电话等设备中数十亿个互连中的基础材料。这些互连是通过原位熔化和固化焊料合金(例如SnAgCu)形成的。但是锡具有低对称性结构,锡从焊料熔体中成核是复杂的,并且在凝固过程中形成的锡和锡合金沉淀物的形态会发生巨大变化(以及随之而来的机械性能)。必须谨慎处理工艺参数对凝固行为,微观结构和性能的影响。该研究中得出的有力证据表明,在许多条件下,当从熔体中冷却接近共晶SnAgCu时,Ag3Sn会在β-Sn之前成核。 β-Sn成核的困难为Ag3Sn沉淀物的成核与β-Sn凝固之间的时间间隔提供了一个时间窗口,在其中可以操纵Ag3Sn沉淀物的形态。因此,对于不同的热历史,例如,在不同的热历史中,观察到了沉淀物数量密度和颗粒间间距的明显变化。不同的冷却速度。观察到Ag3Sn颗粒的平均数量密度和准共晶相的面积随着Ag浓度的增加和冷却速率的增加而增加。剪切强度和剪切疲劳寿命随着假共晶相的面积分数的增加而增加。 SnAgCu焊点在高温下老化后,Ag3Sn颗粒变粗,并且在阻碍位错运动方面变得无效。因此,剪切强度和剪切疲劳性能降低。另一方面,具有在Sn中形成固溶体的成分的合金,例如低浓度的Bi或Sb,在时效时的剪切强度和剪切疲劳寿命均降低。

著录项

  • 作者

    Mutuku, Francis M.;

  • 作者单位

    State University of New York at Binghamton.;

  • 授予单位 State University of New York at Binghamton.;
  • 学科 Physics.;Materials science.
  • 学位 Ph.D.
  • 年度 2016
  • 页码 279 p.
  • 总页数 279
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 水产、渔业;
  • 关键词

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