CT3 as an index of knowledge domain structure: Distributions for Order Analysis and information hierarchies.

摘要

The problem with which this study is concerned is articulating all possible CT3 and K-R 21 reliability measures for every case of a 5 x 5 binary matrix (32,996,500 possible matrices).; The study has three purposes. The first purpose is to calculate CT3 for every matrix and compare the results to the proposed optimum range of 0.3 to 0.5. The second purpose is to compare the results from the calculation of K-R 21 and CT3 reliability measures. The third purpose is to calculate CT3 and K-R 21 on every strand of a class test whose item set has been reduced using the difficulty strata identified by Order Analysis.; The study was conducted by writing a computer program to articulate all possible 5 x 5 matrices. The program also calculated CT3 and K-R 21 reliability measures for each matrix. The nonparametric technique of Order Analysis was applied to two sections of test items to stratify the items into difficulty levels. The difficulty levels were used to reduce the item set from 22 to 9 items. All possible strands or chains of these items were identified so that both reliability measures (CT3 and K-R 21) could be calculated.; One major finding of this study indicates that 0.3 to 0.5 is a desirable range for CT3 (cumulative p = .86 to p = .98) if cumulative frequencies are measured. A second major finding is that the K-R 21 reliability measure produced an invalid result more than half the time. The last major finding is that CT3, rescaled to range between 0 and 1, supports De Vellis' guidelines for reliability measures. The major conclusion is that CT3 is a better measure of reliability since it considers both inter- and inter-item variances.