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Micro/nanoscale tribology of linear tape drives.

机译:线性磁带驱动器的微米/纳米级摩擦学。

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摘要

To increase storage capacity, future high performance linear tape systems will require the use of smoother and thinner magnetic tapes, lower head-tape spacing, lower track width, and higher track densities. In the case of magnetic tapes, smoother surfaces lead to increased static/kinetic friction, and low flying heights lead to partial contact between the head and the tape both of which result in the head and the media degradation and failure due to tribological aspects. Miniaturization of magnetic recording heads requires better understanding of wear mechanisms on a nanometer size scale. Better tape guiding and tape dimensional stability is needed for better tracking performance as track widths are reduced and track densities are increased. Higher track density necessitates the use of narrower data tracks that are placed closer to the tape edge; tape edge damage becomes a concern. During drive operation, damage to the tape edge may result in tape dimensional changes, leading to problems in tracking, generation of loose tape debris, which may show up at the head-tape interface and cause signal loss.;An attempt is made to employ micro/nanotribological techniques to detect wear precursors for the tape head materials. Nano-Kelvin probe is used to detect changes (structural and/or chemical) occurring at the surface top most layers under wear at ultra low loads, which precede appearance of wear debris and/or measurable wear scars. The effect of environmental conditions on the durability of the head-tape interface is studied for a commercial tape drive with a magnetoresistive head and belt driven cartridge loaded with metal particle tape. Possible failure mechanisms are discussed.;An increase in the pole tip recession (a spacing between a head and a tape) results in a signal loss in magnetic tape drives. Test results and analytical modeling suggest that three-body abrasion is the operative wear mode. We study three-body abrasion in detail, by injecting loose particles into the head-tape interface. An experimental setup has been developed. This study of the root cause provides some information about what ultimately needs to be controlled (particle size, concentration, hardness) to minimize pole tip recession.;The research also addresses tape guiding and associated tape edge damage by correlating the occurrence and severity of edge damage with the type of the guides, edge guiding forces, operating conditions and number of file passes. An experimental setup has been developed to measure tape displacement (tape lateral motion) perpendicular to the direction of tape motion and normal forces at the tape edge-flange interface. A methodology has been developed for evaluation of magnetic tape edge quality. The proposed methodology allows quantitative evaluation of the quality of tape edges.
机译:为了增加存储容量,未来的高性能线性磁带系统将需要使用更平滑,更薄的磁带,较低的头带间距,较低的磁道宽度和较高的磁道密度。在磁带的情况下,较光滑的表面导致增加的静/动摩擦,并且低的飞行高度导致磁头和磁带之间的部分接触,这两者都导致磁头和介质由于摩擦学方面的劣化和故障。磁记录头的小型化需要更好地了解纳米级的磨损机理。随着磁道宽度的减小和磁道密度的增加,需要更好的磁带导引和磁带尺寸稳定性,以获得更好的跟踪性能。较高的磁道密度需要使用更窄的数据磁道,这些数据磁道放置在靠近磁带边缘的位置。磁带边缘损坏成为一个问题。在驱动器操作期间,对磁带边缘的损坏可能会导致磁带尺寸变化,从而导致跟踪问题,产生松散的磁带碎片,这些问题可能会出现在头带界面并造成信号损失。显微/纳米摩擦学技术来检测带头材料的磨损前体。纳米开尔文探针用于检测超低载荷下磨损最表面层上发生的变化(结构和/或化学变化),这些变化先于磨损碎片和/或可测量的磨损痕迹出现。对于带有磁阻磁头和装有金属粒子带的带驱动盒式磁带的商用磁带机,研究了环境条件对磁带界面耐久性的影响。讨论了可能的故障机理。极尖凹进量的增加(磁头和磁带之间的间距)会导致磁带驱动器中的信号丢失。测试结果和分析模型表明,三体磨损是可操作的磨损方式。我们通过将松散的颗粒注入头带界面来详细研究三体磨损。实验装置已经开发出来。这项根本原因的研究提供了一些有关最终需要控制哪些信息(粒径,浓度,硬度)以最大程度地减少磁极尖端后退的信息。该研究还通过关联边缘的出现和严重程度来解决磁带导带和相关的磁带边缘损坏导板类型,边缘导引力,工作条件和锉刀通过次数造成损坏。已经开发出一种实验装置来测量垂直于磁带运动方向的磁带位移(磁带横向运动)和磁带边缘-法兰界面处的法向力。已经开发出一种用于评估磁带边缘质量的方法。所提出的方法允许定量评估带边缘的质量。

著录项

  • 作者

    Goldade, Anton Viktorovich.;

  • 作者单位

    The Ohio State University.;

  • 授予单位 The Ohio State University.;
  • 学科 Engineering Mechanical.
  • 学位 Ph.D.
  • 年度 2003
  • 页码 209 p.
  • 总页数 209
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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