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A 20-GHz bipolar varactor-tuned VCO using switched capacitors to add tuning range.

机译:使用开关电容器的20 GHz双极变容二极管调谐VCO,以增加调谐范围。

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摘要

The increasing demand for telecommunication bandwidth has driven data rates increasingly higher. To meet the eventual demand for more bandwidth next generation systems are slated to run at 40GB/s. Although, it may be possible to implement 40GB/s data rates in advanced materials such as GaAs or InP eventually the clock and data recovery (CDR) circuits for these systems will have to be designed in a silicon (Si) technology.; In this thesis, the affects of various noise sources on the phase-locked loop (PLL) of a CDR circuit are simulated and discussed. Drawing from the simulation results, suggestions for the selection of CDR PLL loop parameters are given. As well, a dual-rate (10/20GHz) CDR PLL is discussed.; The most difficult block to design in a CDR PLL is the oscillator. If a VCO is used, it must be designed so that it has a large enough tuning range (+/-10%) to make up for variations in manufacturing. To accomplish this, a 20-GHz voltage-controlled oscillator (VCO) with on-chip inductors is presented. Wide-band tuning is accomplished in this VCO using a combination of switched capacitors and varactor diodes. Design guidelines for the oscillator and guidelines for switched-capacitor circuit design are given.; Finally, the VCO in simulation had a worst case phase noise performance of -73.5dBc/Hz at a 100kHz offset from a 20GHz carrier. Measurement results were not able to corroborate the simulation results. The reasons for the measurement failure is analysed.
机译:对电信带宽的日益增长的需求推动了数据速率的不断提高。为了满足最终对更大带宽的需求,下一代系统计划以40GB / s的速度运行。尽管有可能在诸如GaAs或InP之类的先进材料中实现40GB / s的数据速率,但最终这些系统的时钟和数据恢复(CDR)电路必须采用硅(Si)技术进行设计。本文模拟并讨论了各种噪声源对CDR电路锁相环(PLL)的影响。根据仿真结果,给出了CDR PLL环路参数选择的建议。同样,讨论了双速率(10 / 20GHz)CDR PLL。 CDR PLL中最难设计的模块是振荡器。如果使用VCO,则必须对其进行设计,使其具有足够大的调整范围(+/- 10%),以弥补制造中的变化。为此,提出了一种带有片上电感器的20 GHz压控振荡器(VCO)。通过结合使用开关电容器和变容二极管,在该VCO中完成宽带调谐。给出了振荡器的设计指南和开关电容器电路设计指南。最后,仿真中的VCO在距20GHz载波100kHz的偏移下具有-73.5dBc / Hz的最坏情况下的相位噪声性能。测量结果不能证实模拟结果。分析了测量失败的原因。

著录项

  • 作者

    Stewart, Malcolm D.;

  • 作者单位

    Carleton University (Canada).;

  • 授予单位 Carleton University (Canada).;
  • 学科 Engineering Electronics and Electrical.
  • 学位 M.A.Sc.
  • 年度 2003
  • 页码 143 p.
  • 总页数 143
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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