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Initial stage growth of heteroepitaxial oxide thin films on oxide and metal substrates.

机译:在氧化物和金属基底上异质外延氧化物薄膜的初始生长。

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摘要

Complex oxide thin films have been extensively studied due to their versatile physical properties. The fabrication of epitaxial multilayered heterostructures based on complex oxides requires the ability to integrate these materials with desirable substrates with atomic layer control of the thin films. We have investigated the initial stage growth of heteroepitaxial oxide thin films on oxide and metal substrates, employing pulsed laser deposition (PLD) with in-situ high pressure reflection high energy electron diffraction (RHEED).; For the epitaxy of oxide-on-oxide, Sr1- xCaxRuO3 oxides ( x = 0, 0.5, and 1) were chosen as a model system and grown on four different oxide substrates with varying lattice misfits from -1.92% tensile to +3.64% compressive. Our study showed systematic changes in growth modes, growth morphologies, and strain relaxation as a function of lattice misfits (&egr;). At the initial stage, Sr1- xCaxRuO3 thin films had growth mode transitions from 2-dimensional (2D) layer-by-layer to step-flow (&egr; 1%) or 3D islands (&egr; ≥ 1%). In addition, termination conversion from B-site to A-site took place during the initial stage growth of Sr1-xCaxRuO 3 thin films on TiO2-terminated (001) SrTiO3 substrates.; For the epitaxy of oxide-on-metal, oxide buffer layers such as SrTiO 3, CaTiO3, CeO2, and Y2O3 were grown on epitaxial (001) Ni thin films. It was shown that initial stage growth of the oxide buffer layers strongly depended on the surface structures of the (001) Ni surfaces. Purely epitaxial oxide buffer layers could be achieved only on the c(2 x 2)-O reconstructed (001) Ni surface which was formed from a dissociation of water vapor in a forming gas environment. In contrast, growth on textured NiO surfaces or clean Ni surfaces produced textured oxide thin films with multi-domains.; Understanding the initial stage growth of epitaxial oxide thin films on both oxide and metal substrates was essential in achieving smooth, high-quality epitaxial thin films. Our findings will also provide the guideline in the atomic scaled control in the epitaxial oxide heterostructure devices such as oxide based magnetic tunnel junctions and YBa2Cu3O 7 coated conductors.
机译:由于复合氧化物薄膜具有多种多样的物理特性,因此已被广泛研究。基于复合氧化物的外延多层异质结构的制造要求能够将这些材料与所需的基板集成在一起,并控制薄膜的原子层。我们利用脉冲激光沉积(PLD)和原位高压反射高能电子衍射(RHEED)研究了在氧化物和金属基底上异质外延氧化物薄膜的初始生长。对于氧化物对氧化物的外延,选择Sr1-xCaxRuO3氧化物(x = 0、0.5和1)作为模型系统,并在四种不同的氧化物基底上生长,这些基底具有从-1.92%拉伸到+ 3.64%的不同晶格失配压缩的。我们的研究表明,生长方式,生长形态和应变弛豫随晶格失配而发生系统性变化(&egr;)。在初始阶段,Sr1-xCaxRuO3薄膜具有从二维(2D)逐层到逐步流动(&egr; <1%)或3D岛(&egr;≥1%)的生长模式过渡。此外,在TiO2终止的(001)SrTiO3衬底上Sr1-xCaxRuO 3薄膜的初始生长过程中,发生了从B位到A位的终止转化。对于金属氧化物外延,在外延(001)Ni薄膜上生长SrTiO 3,CaTiO3,CeO2和Y2O3等氧化物缓冲层。已经表明,氧化物缓冲层的初始生长强烈地取决于(001)Ni表面的表面结构。纯外延氧化物缓冲层只能在c(2 x 2)-O重建(001)Ni表面上实现,该表面是在形成气体环境中由水蒸气的解离形成的。相反,在织构化的NiO表面或干净的Ni表面上的生长产生具有多畴的织构化的氧化物薄膜。理解在氧化物和金属衬底上外延氧化物薄膜的初始生长对于获得光滑,高质量的外延薄膜至关重要。我们的发现还将为外延氧化物异质结构器件(例如基于氧化物的磁性隧道结和YBa2Cu3O 7涂层导体)中的原子尺度控制提供指导。

著录项

  • 作者

    Choi, Jung-Hoon.;

  • 作者单位

    The University of Wisconsin - Madison.;

  • 授予单位 The University of Wisconsin - Madison.;
  • 学科 Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2004
  • 页码 142 p.
  • 总页数 142
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

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