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Growth and ferromagnetic semiconducting properties of titanium dioxide thin films: An oxide-diluted magnetic semiconductor (O-DMS) for spintronics.

机译:二氧化钛薄膜的生长和铁磁半导体性能:用于自旋电子学的氧化物稀释的磁性半导体(O-DMS)。

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摘要

Single-phase (001) anatase thin films have been realized via epitaxial stabilization on (001) LaAlO3 substrates using reactive sputter deposition. Phase-pure anatase can be achieved using either water vapor or oxygen as the oxidizing species, although crystallinity is slightly degraded for films grown with water vapor. The use of hydrogen during growth to manipulate Ti valence appears possible, although controlling phase formation remains challenging.; The RF reactive sputtering method is used to prepare titanium dioxide thin films on Si(100) p-type at temperature ranging from 550 to 750°C. For the temperature range examined, only the rutile (200) phase was observed in the range of temperature between 600 and 650°C with Ar gas. The intensity of rutile (200) phase was much less with P(O2) than that with P(H 2O) at a total pressure of 15 mtorr with Ar gas. Hall coefficient and magnetoresistance results for the TiO2 on Si(100) with 10 -3 Torr of a water vapor at 300K shows typical n-type semiconductor behavior at 300K.; Epitaxial CoxTi1-xO2 anatase thin films were grown on (001)LaAlO3 by a reactive RF magnetron co-sputter deposition with water vapor serving as the oxidant. The use of water as the oxygen source proves useful in growing oxygen-deficient, semiconducting Co xTi1-xO2 by reactive sputter deposition, with undoped and Co-doped TiO2 thin films showing n-type semiconductor behavior, and carrier concentrations of 1017 to 1018 cm-3. Magnetization measurements of Cox Ti1-xO2 (x = 0.07) thin films reveal ferromagnetic behavior in the M-H loop at room temperature with a saturation magnetization on the order of 0.6 Bohr magnetons/Co. X-ray photoemission spectrometry indicates that the Co cations are in the Co2+ valence state. However, chemical analysis of surface structure indicates that the cobalt segregates into a Co-enriched particles on the surface of films.; From SADPs, we confirm that the nanoclusters observed on the surface of the Co0.07Ti0.93O2 are Co-enriched anatase.; From the resistivity measurement as a function of magnetic field, the ordinary Hall effect is dominant in the undoped and Co0.02Ti 0.98O2-delta thin films. For each film, the magnetoresistance was positive and increase monotonically with increasing magnetic field. The anomalous Hall effect contribution is observed for the Co0.10Ti 0.90O2-delta films grown under lower water vapor pressure due to more oxygen deficiency.
机译:已经通过使用反应性溅射沉积在(001)LaAlO3衬底上通过外延稳定化实现了单相(001)锐钛矿薄膜。尽管使用水蒸气生长的薄膜的结晶度会稍微降低,但可以使用水蒸气或氧气作为氧化物质来实现纯相的锐钛矿。尽管在控制相形成方面仍然具有挑战性,但在生长过程中使用氢来控制Ti价似乎是可能的。 RF反应溅射法用于在550至750°C的温度范围内以Si(100)p型制备二氧化钛薄膜。对于所检查的温度范围,使用Ar气在600至650°C的温度范围内仅观察到金红石相(200)。在氩气总压力为15 mtorr的情况下,P(O2)的金红石相(200)的强度比P(H 2O)的低得多。在300K时,水蒸气为10 -3托的Si(100)上TiO2的霍尔系数和磁阻结果表明,在300K时,典型的n型半导体行为。通过以水蒸气作为氧化剂的反应性RF磁控管共溅射沉积在(001)LaAlO3上生长外延CoxTi1-xO2锐钛矿薄膜。事实证明,使用水作为氧气源可用于通过反应性溅射沉积来生长缺氧的半导体Co xTi1-xO2,未掺杂和共掺杂的TiO2薄膜表现出n型半导体行为,载流子浓度为1017至1018 cm -3。 Cox Ti1-xO2(x = 0.07)薄膜的磁化测量显示,室温下M-H回路中的铁磁行为,饱和磁化强度约为0.6 Bohr磁子/ Co。 X射线光发射光谱法表明Co阳离子处于Co 2+价态。然而,表面结构的化学分析表明,钴在薄膜表面上分离成富钴的颗粒。从SADPs,我们确认在Co0.07Ti0.93O2表面观察到的纳米簇是富含Co的锐钛矿。从电阻率测量值作为磁场的函数,普通霍尔效应在未掺杂和Co0.02Ti0.98O2-δ薄膜中占主导地位。对于每个膜,磁阻为正,并且随着磁场的增加而单调增加。由于氧气不足,在较低的水蒸气压力下生长的Co0.10Ti0.90O2-δ薄膜观察到异常的霍尔效应贡献。

著录项

  • 作者

    Jeong, Byoung-Seong.;

  • 作者单位

    University of Florida.;

  • 授予单位 University of Florida.;
  • 学科 Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2004
  • 页码 128 p.
  • 总页数 128
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

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