Scanning angle total internal reflection Raman spectroscopy and plasmon enhancement techniques as a tool for interfacial analysis.

摘要

In order to understand phenomena occurring on the nanometer length scale with optical spectroscopies, the development of new instrumentation and chemical analysis techniques are necessary. The focus of this dissertation is the development of a scanning angle total internal reflection (TIR) Raman microscope and TIR Raman signal enhancement techniques with a near infrared excitation source. The instrument allows for the collection of Raman scatter over a tunable distance (micrometers to tens of nanometers) from an interface with axial resolution on the order of 30 nm. TIR Raman scattering enhancement techniques utilizing surface plasmon supporting metal films and plasmon waveguides are also described that reduce background, increase reproducibility, and allow for monolayer sensitivity.