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Studies of radiation effects on pixel sensors for the CMS experiment and design of radiation hard sensors for future upgrades of LHC upgrade.

机译:为CMS实验研究辐射对像素传感器的影响,并为LHC升级的未来升级设计辐射硬传感器。

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摘要

The CMS experiment which is currently under construction at the Large Hadron Collider (LHC) at CERN (Geneva, Switzerland) will contain a pixel detector that provides in its final configuration three space points per track close to the interaction point of the colliding beams. The readout chip is expected to survive a particle fluence of 6 x 1014 neq/cm2 and therefore all components of the hybrid pixel detector have to perform well up to at least this fluence. This requires the silicon to operate partially depleted after irradiation and therefore "n in n" concept has been chosen. In order to perform IV tests on wafers to certify the quality of sensors and to hold accidentally unconnected pixels close to ground potential a resistive path between the pixels has been implemented by openings in the p -stop implants surrounding every pixel cell. Prototypes of such sensors have been produced by two different companies and their properties have been extensively tested before and after irradiation. Their behavior under irradiation and aging has been characterized. A new type of design for detectors, semi 3D, for future experiments has also been studied and discussed.
机译:目前正在欧洲核子研究组织(瑞士日内瓦)的大型强子对撞机(LHC)上进行的CMS实验将包含一个像素检测器,该像素检测器在其最终配置中为每个轨道提供三个空间点,这些空间点接近碰撞光束的相互作用点。预计读出芯片将承受6 x 1014 neq / cm2的粒子通量,因此,混合像素检测器的所有组件都必须表现良好,至少要达到此通量。这要求硅在辐照后部分耗尽,因此选择了“ n in n”的概念。为了在晶片上执行IV测试以证明传感器的质量并保持意外未连接的像素接近地电势,已通过围绕每个像素单元的p停止注入中的开口来实现像素之间的电阻路径。这种传感器的原型是由两家不同的公司生产的,并且在辐照之前和之后都对其性能进行了广泛的测试。它们在辐射和老化下的行为已被表征。还研究和讨论了一种新型的探测器设计,即用于未来实验的半3D设计。

著录项

  • 作者

    Roy, Amitava.;

  • 作者单位

    Purdue University.;

  • 授予单位 Purdue University.;
  • 学科 Physics Elementary Particles and High Energy.
  • 学位 Ph.D.
  • 年度 2005
  • 页码 136 p.
  • 总页数 136
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 高能物理学;
  • 关键词

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