Variable Temperature SiO2 Stripes Spectroscopy Taken by Customized Scattering Type Scanning Near-field Optical Microscopy.

摘要

Variable temperature scattering-type scanning near-field optical microscopy is the system we built up from basis to explore the phase transition under low temperature. It has advantages of be able to take topography and spectroscopy simultaneously. What the SNOM system measures is the reflective effivient, it is determinde by the dielectric value of the sample, which is an intrinsic chemical propertiy. In this experiment, we taken spectroscopy of a sample with silicon dioxide stripes doped on the silicon substrate, get the contrast of silicon/silison dioxide, which is accord to the prediction of two models. Furthermore, the different contrast under various temperature reveals the temperature dependent dielectric function.