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Study of interfacial crack propagation in flip chip assemblies with nano-filled underfill materials.

机译:纳米填充底部填充材料在倒装芯片组件中界面裂纹扩展的研究。

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摘要

No-flow underfill materials that cure during the solder reflow process is a relatively new technology. Although there are several advantages in terms of cost, time and processing ease, there are several reliability challenges associated with no-flow underfill materials. When mum-sized filler particles are introduced in no-flow underfills to enhance the solder bump reliability, such filler particles could prevent the solder bumps making reliable electrical contacts with the substrate pads during solder reflow, and therefore, the assembly yield would be adversely affected. The use of nano-sized filler particles can potentially improve assembly yield while offering the advantages associated with filled underfill materials.; The objective of this thesis is to study the thermo-mechanical reliability of nano-filled epoxy underfills (NFU) through experiments and theoretical modeling. In this work, the thermo-mechanical properties of NFU's with 20-nm filler particles have been measured. An innovative residual stress test method has been developed to measure the interfacial fracture toughness. Using the developed residual stress method and the single-leg bending test, the mode-mixity-dependent fracture toughness for NFU-SiN interface has been determined. In addition to such monotonic interfacial fracture characterization, the interface crack propagation under thermo-mechanical fatigue loading has been experimentally characterized, and a model for fatigue interface crack propagation has been developed. A test vehicle comprising of several flip chips was assembled using the NFU material and the reliability of the flip-chip assemblies was assessed under thermal shock cycles between -40°C and 125°C. The NFU-SiN interfacial delamination propagation and the solder bump reliability were monitored. In parallel, numerical models were developed to study the interfacial delamination propagation in the flip chip assembly using conventional interfacial fracture mechanics as well as cohesive zone modeling. Predictions for interfacial delamination propagation using the two approaches have been compared. Based on the theoretical models and the experimental data, guidelines for design of NFUs against interfacial delamination have been developed.
机译:在焊料回流过程中固化的无流动底部填充材料是一种相对较新的技术。尽管在成本,时间和加工便利性方面有多个优势,但与不流动的底部填充材料相关的可靠性也存在一些挑战。当在不流动的底部填充物中引入妈妈大小的填料颗粒以提高焊料凸点的可靠性时,这种填料颗粒可能会阻止焊料凸点在回流焊过程中与基板焊盘可靠地电接触,因此,组装良率将受到不利影响。 。纳米填料颗粒的使用可以潜在地提高组装产量,同时提供与填充的底部填充材料相关的优点。本文的目的是通过实验和理论建模研究纳米填充的环氧树脂底层填充材料(NFU)的热机械可靠性。在这项工作中,已经测量了具有20 nm填料颗粒的NFU的热机械性能。已经开发出一种创新的残余应力测试方法来测量界面断裂韧性。使用改进的残余应力方法和单腿弯曲试验,确定了NFU-SiN界面依赖于模式混合的断裂韧性。除了这种单调界面断裂特征,还对热机械疲劳载荷下的界面裂纹扩展进行了实验表征,并建立了疲劳界面裂纹扩展的模型。使用NFU材料组装了包含多个倒装芯片的测试车,并在-40°C至125°C的热冲击循环下评估了倒装芯片组件的可靠性。监测NFU-SiN界面分层的传播和焊料凸点的可靠性。并行地,开发了数值模型以使用常规界面断裂力学以及内聚区模型研究倒装芯片组件中的界面分层扩展。比较了使用两种方法进行界面分层扩散的预测。基于理论模型和实验数据,制定了抗界面剥离的NFU设计指南。

著录项

  • 作者

    Mahalingam, Sakethraman.;

  • 作者单位

    Georgia Institute of Technology.;

  • 授予单位 Georgia Institute of Technology.;
  • 学科 Engineering Mechanical.; Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2005
  • 页码 150 p.
  • 总页数 150
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 机械、仪表工业;工程材料学;
  • 关键词

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