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Tilted fiber grating refractive index sensor and interrogation device.

机译:倾斜式光纤光栅折射率传感器和询问装置。

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摘要

This masters thesis presents a new way to measure the refractive index using Tilted Fiber Bragg Grating. We start by studying the properties of the TFBG spectrum in different surrounding refractive indices. We show that the notches of the TFBG spectrum displace as the surrounding refractive index changes. By picking up a particular notch (i.e. a particular mode) and tracking the shifts in the position of the center wavelength of this mode, we could generate curves by use of which one can determine the refractive index of the surrounding material. This property of the TFBG spectrum based on which the position of the modes displaces in response to the change in the surrounding refractive index is due to the fact that the tilt angle of the grating planes makes the light to couple to the cladding modes and because these cladding modes travel close to the cladding-external material surface, they can sense the change in the external material refractive index. Another interesting point mentioned in this research was that one does not need to worry about the shape of the mode used to measure the refractive index. This is true because as long as the modes have the same distance from Bragg resonance, they react exactly the same to the change in the external refractive index.;The second part of the thesis dealt with the Arrayed Waveguide Grating as a promising device to be used as the interrogator of the TFBG refractive index sensor. A very preliminary study was performed on the effect of fabrication errors on the performance of AWG. An optimum design based on the requirements of an ideal interrogator unit, in terms of crosstalk, channel spacing and device size was presented. This design was simulated and the results of the simulation were presented.
机译:本硕士论文提出了一种使用倾斜光纤布拉格光栅测量折射率的新方法。我们首先研究TFBG光谱在不同周围折射率下的特性。我们表明,TFBG谱图的缺口随着周围折射率的变化而移位。通过拾取特定的凹口(即特定模式)并跟踪该模式的中心波长位置的变化,我们可以生成曲线,利用该曲线可以确定周围材料的折射率。 TFBG光谱的这种特性是模式的位置根据周围折射率的变化而移动的基础,这是由于光栅平面的倾斜角使光耦合到包层模式这一事实所致,并且由于这些包层模式行进到靠近包层外部材料的表面,它们可以感知外部材料折射率的变化。这项研究中提到的另一个有趣的观点是,人们无需担心用于测量折射率的模式的形状。的确如此,因为只要模距布拉格共振的距离相同,它们对外部折射率的变化就会产生完全相同的反应。;论文的第二部分将阵列波导光栅作为一种有前途的器件用作TFBG折射率传感器的询问器。对制造误差对AWG性能的影响进行了非常初步的研究。在串扰,通道间隔和设备尺寸方面,基于理想询问器单元的要求,提出了一种最佳设计。仿真了该设计,并给出了仿真结果。

著录项

  • 作者

    Jafari, Amir.;

  • 作者单位

    Carleton University (Canada).;

  • 授予单位 Carleton University (Canada).;
  • 学科 Engineering Electronics and Electrical.
  • 学位 M.A.Sc.
  • 年度 2006
  • 页码 84 p.
  • 总页数 84
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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