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Critical behavior of superconductors and electrical transport properties of carbon nanotube thin films.

机译:超导体的临界行为和碳纳米管薄膜的电传输性能。

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摘要

With AC microwave measurements from 10 MHz up to 50 GHz and DC nanovolt level measurements we have investigated the superconducting phase transition of YBa2Cu3O7-delta films in zero magnetic field and electrical transport properties of single walled carbon nanotube networks.;We studied the microwave conductivity of YBa2Cu3O 7-delta thin films around Tc for different incident microwave power and observed that the microwave fluctuation conductivity deviates from scaling theory at low frequency around Tc. We systematically investigated the length scales involved in AC measurements and found the probed length scale depends on both frequency and current. At low current density J but high frequency o, we observed critical behavior without hindrance from finite-size effects. However, at low current density J and low frequency o, the experimentally probed length scale LAC may approach the thickness d of the sample, and then the critical behavior will be destroyed by finite-size effects. In this regime, we can not observe the phase transition.;With very small applied microwave power, specifically -46dBm, and high frequency data, we have investigated the critical fluctuations of YBa 2Cu3O7-delta thin films around T c. It is shown that the determination of Tc is crucial for obtaining critical exponents. Improved temperature stability and conductivity calibration allow us to take high quality data at small temperature intervals (50mK). This improves the conventional data analysis method and allows a new method of extracting exponents to be developed. With these two methods, consistent values of Tc and the critical exponent were precisely determined. Experiments on 6 samples have been done and the results give a dynamical scaling exponent z = 1.55+/-0.15. The scaling behavior of the fluctuation conductivity is also established.;We have also investigated fluctuation effects of YBa 2Cu3O7-delta by doing frequency-dependent microwave conductivity measurements and dc current-voltage characteristics on the same film. The dc measurement verified that the applied microwave power -46dBm in our ac measurement is small enough for the correct determination of Tc and critical exponents. For both dc and ac experiments the scaling behavior of the data was investigated. We found that the dc measurement could be affected by disorder. For high quality YBCO films and crystal, the critical exponent z is also around 1.5, which is consistent with ac measurement.;Finally, using our broadband experimental technique and DC current-voltage characteristic measurement system, we measured the transport properties of single-walled carbon nanotube films. Based on the real and imaginary parts of the microwave conductivity, we calculated the shielding effectiveness for various film thickness. Shielding effectiveness of 43 dB at 10 MHz and 28 dB at 10 GHz is found for films with 90% optical transmittance, which suggests that single walled carbon nanotube (SWCNT) films are promising as a type of transparent microwave shielding material. We also investigated the frequency and electric field dependent conductivity of single walled carbon nanotube networks of various densities. We found the ac conductivity as a function of frequency follows the extended pair approximation model and increases with frequency above an onset frequency o0 which varies over seven decades with a range of film thickness from sub-monolayer to 200 nm. The nonlinear electric field-dependent conductivity shows strong dependence on film thickness as well. Measurement of the electric field dependence of the resistance R(| E&ar; |) allows for the determination of the localization length scale L of localized states, which is found to systematically decrease with increasing film thickness. The onset frequency o0 of enhanced ac conductivity and the localization length scale L of SWCNT networks are found to be correlated, and an empirical formula relating them has been proposed. Such studies will help the understanding of transport properties and broaden the applications of this novel material system.
机译:通过从10 MHz到50 GHz的交流微波测量和直流纳伏电平测量,我们研究了YBa2Cu3O7-δ薄膜在零磁场下的超导相变和单壁碳纳米管网络的电传输特性。 YBa2Cu3O 7δ薄膜在Tc附近具有不同的入射微波功率,并观察到在Tc附近的低频处,微波起伏电导率偏离了定标理论。我们系统地研究了交流测量中涉及的长度刻度,发现所探测的长度刻度取决于频率和电流。在低电流密度J但高频率o的情况下,我们观察到了临界行为,而不受大小限制效应的影响。但是,在低电流密度J和低频率o下,实验探测的长度标尺LAC可能接近样品的厚度d,然后临界行为将受到有限尺寸效应的破坏。在这种情况下,我们无法观察到相变。在施加很小的微波功率(具体为-46dBm)和高频数据的情况下,我们研究了YBa2Cu3O7-δ薄膜在T c附近的临界波动。结果表明,Tc的确定对于获得关键指数至关重要。改进的温度稳定性和电导率校准功能使我们能够以较小的温度间隔(50mK)采集高质量的数据。这改进了传统的数据分析方法,并允许开发一种提取指数的新方法。使用这两种方法,可以精确确定Tc和临界指数的一致值。已经对6个样品进行了实验,结果给出了动态缩放指数z = 1.55 +/- 0.15。我们还通过在同一薄膜上进行频率相关的微波电导率测量和直流电流-电压特性,研究了YBa2Cu3O7-δ的波动效应。直流测量证明,在我们的交流测量中施加的微波功率-46dBm足够小,可以正确确定Tc和关键指数。对于直流和交流实验,都研究了数据的缩放行为。我们发现直流测量可能会受到干扰的影响。对于高质量的YBCO薄膜和晶体,其临界指数z也在1.5左右,这与交流电测量相符。最后,使用我们的宽带实验技术和直流电流-电压特性测量系统,我们测量了单壁的传输特性碳纳米管薄膜。基于微波传导率的实部和虚部,我们计算了各种膜厚度的屏蔽效果。对于具有90%透光率的薄膜,发现其在10 MHz下的屏蔽效率为43 dB,在10 GHz下为28 dB,这表明单壁碳纳米管(SWCNT)膜有望成为一种透明的微波屏蔽材料。我们还研究了各种密度的单壁碳纳米管网络的频率和电场依赖性电导率。我们发现交流电导率是频率的函数,遵循扩展对近似模型,并随着高于开始频率o0的频率而增加,该开始频率o0持续七十年,膜厚度范围从亚单层到200 nm。与非线性电场有关的电导率也显示出对膜厚度的强烈依赖性。电阻R(| E&ar; |)的电场依赖性的测量允许确定局部状态的局部长度标度L,发现局部状态的局部长度标度L随着膜厚度的增加而系统地减小。发现增强交流电导率的起始频率o0与SWCNT网络的定位长度尺度L相关,并提出了与它们相关的经验公式。这些研究将有助于理解传输特性并拓宽这种新型材料系统的应用范围。

著录项

  • 作者

    Xu, Hua.;

  • 作者单位

    University of Maryland, College Park.;

  • 授予单位 University of Maryland, College Park.;
  • 学科 Physics Condensed Matter.
  • 学位 Ph.D.
  • 年度 2007
  • 页码 247 p.
  • 总页数 247
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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