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Dual interferometer system for measuring index of refraction .

机译:双干涉仪测量折射率。

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摘要

The optical power of a lens is determined by the surface curvature and the refractive index, n. Knowledge of the index is required for accurate lens design models and for examining material variations from sample to sample. The refractive index of glass can be accurately measured using a prism spectrometer, but measuring the index of soft contact lens materials presents many challenges. These materials are non-rigid, thin, and must remain hydrated in a saline solution during testing. Clearly an alternative to a prism spectrometer must be used to accurately measure index.; A Dual Interferometer System has been designed, built and characterized as a novel method for measuring the refractive index of transparent optical materials, including soft contact lens materials. The first interferometer is a Low Coherence Interferometer in a Twyman-Green configuration with a scanning reference mirror. The contact lens material sample is placed in a measurement cuvette, where it remains hydrated. By measuring the locations of the multiple optical interfaces, the physical thickness t of the material is measured. A new algorithm has been developed for processing the low coherence signals obtained from the reflection at each optical interface.; The second interferometer is a Mach-Zehnder interferometer with a tunable HeNe laser light source. This interferometer measures the optical path length (OPL) of the test sample in the cuvette in transmission as a function of five wavelengths in the visible spectrum. This is done using phase-shifting interferometry. Multiple thickness regions are used to solve 2pi phase ambiguities in the OPL.; The outputs of the two interferometers are combined to determine the refractive index as a function of wavelength: n(lambda) = OPL(lambda)/t. Since both t and OPL are measured using a detector array, n is measured at hundreds of thousands of data points. A measurement accuracy of 0.0001 in refractive index is achieved with this new instrument, which is verified using custom glass calibration samples.
机译:透镜的屈光力由表面曲率和折射率n决定。准确的镜片设计模型和检查样品之间材料差异时需要了解该指数。可以使用棱镜光谱仪精确测量玻璃的折射率,但是测量软性隐形眼镜材料的折射率提出了许多挑战。这些材料非刚性,薄且在测试过程中必须保持在盐水溶液中的水合状态。显然,必须使用棱镜光谱仪的替代品来精确地测量折射率。已经设计,构建了双干涉仪系统,并将其作为一种用于测量透明光学材料(包括软性隐形眼镜材料)的折射率的新颖方法。第一个干涉仪是Twyman-Green配置的低相干干涉仪,带有扫描参考镜。隐形眼镜材料样品放置在测量比色杯中,并保持水合状态。通过测量多个光学接口的位置,可以测量材料的物理厚度t。已经开发出一种新的算法来处理从每个光接口处的反射获得的低相干信号。第二个干涉仪是带有可调HeNe激光光源的Mach-Zehnder干涉仪。该干涉仪测量在透射中比色皿中测试样品的光程长度(OPL),它是可见光谱中五个波长的函数。这是使用相移干涉术完成的。多个厚度区域用于解决OPL中的2pi相歧义。将两个干涉仪的输出进行组合,以确定作为波长的函数的折射率:n(λ)= OPL(λ)/ t。由于t和OPL均使用检测器阵列进行测量,因此n在数十万个数据点处进行测量。这款新仪器可实现0.0001的折射率测量精度,可使用定制的玻璃校准样品进行验证。

著录项

  • 作者

    Goodwin, Eric Peter.;

  • 作者单位

    The University of Arizona.;

  • 授予单位 The University of Arizona.;
  • 学科 Physics Optics.
  • 学位 Ph.D.
  • 年度 2007
  • 页码 357 p.
  • 总页数 357
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 光学;
  • 关键词

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