首页> 外文会议>The Twenty-third annual meeting of the American Society of Precision Engineering and the Twelfth ICPE >MEASURING MACHINES WITH INTERFEROMETRICAL STYLUS FOR FORM MEASUREMENT OF PRECISE MECHANICAL PARTS
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MEASURING MACHINES WITH INTERFEROMETRICAL STYLUS FOR FORM MEASUREMENT OF PRECISE MECHANICAL PARTS

机译:带有干涉笔的测量机,用于测量精密机械零件的形状

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An interferometrical stylus system for form measuring machines which allows form and diameter measurements on precision mechanical parts with tolerances of less than 1um has been developed, built, tested and already used under shop floor conditions.rnThe optical system is based on a novel concept of short coherence heterodyne interferometry and achieved distance equivalent noise level of 1a < 1nm with a sampling frequency of 10kHz.rnIn order to examine the measuring capability of the system for tolerances smaller than 1 urn we developed dedicated process algorithms and performed a substantial amount of test measurements.rnThe interferometrical stylus is already working in following machines:rn1. Mahr MFU100WP for universal measurementsrn2. Bosch FMS 1000 for fast measurements near the production linern3. Mycrona ALTERA Nano for measuring of small structuresrnFurther a special software for post measurement visualization and processing of 3D interfrometrical data has been developed.
机译:用于形状测量机的干涉式测针系统,已开发,制造,测试并已在车间条件下使用,该系统允许在公差小于1um的精密机械零件上测量形状和直径。rn该光学系统基于短的新颖概念相干外差干涉测量法,在10kHz的采样频率下实现了1a <1nm的距离等效噪声级。为了检查系统对小于1 um的公差的测量能力,我们开发了专用的处理算法并进行了大量测试。干涉测针已经在以下机器中工作:rn1。 Mahr MFU100WP用于通用测量rn2。 Bosch FMS 1000可在生产线附近进行快速测量rn3。 Mycrona ALTERA Nano用于小型结构的测量。此外,还开发了一种特殊的软件,用于后测量的可视化和3D干涉测量数据的处理。

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