Cavendish Laboratory, University of Cambridge, J. J. Thomson Avenue, Cambridge CB3 0HE, United Kingdom;
Cavendish Laboratory, University of Cambridge, J. J. Thomson Avenue, Cambridge CB3 0HE, United Kingdom;
Cavendish Laboratory, University of Cambridge, J. J. Thomson Avenue, Cambridge CB3 0HE, United Kingdom;
Department of Physics, Clarendon Laboratory, University of Oxford, Oxford OX1 3PU, United Kingdom;
Cavendish Laboratory, University of Cambridge, J. J. Thomson Avenue, Cambridge CB3 0HE, United Kingdom;
Cavendish Laboratory, University of Cambridge, J. J. Thomson Avenue, Cambridge CB3 0HE, United Kingdom;
terahertz; topological insulators; spectroscopy; bismuth selenide;
机译:拓扑绝缘体Bi_2Se_3薄膜中的时间分辨太赫兹动力学
机译:通过Terahertz时域光谱研究的GaN薄膜点缺陷性能的温度依赖性
机译:勘误:“太赫兹时域光谱研究的超薄Bi(001)薄膜中的表面金属态” [Appl。物理来吧100,251605(2012)]
机译:使用Terahertz光谱研究Bi_2Se_3薄膜拓扑表面状态的温度演变
机译:同步加速器X射线光谱和成像研究了ZnO薄膜和钢表面的表面形态和化学演变。
机译:锑超薄膜中拓扑表面态的演化
机译:CRXSB2-XTE3拓扑绝缘体薄膜中铁磁反应的温度依赖性研究了三赫兹光谱和磁传输研究。