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Temperature evolution of topological surface states in Bi_2Se_3 thin films studied using terahertz spectroscopy

机译:太赫兹光谱研究Bi_2Se_3薄膜拓扑表面态的温度演化

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We have measured the terahertz (THz) conductance of a 23 quintuple layer thick film of bismuth selenide (Bi_2Se_3) and found signatures for topological surface states (TSSs) below 50 K. We provide evidence for a topological phase transition as a function of lattice temperature by optical means. In this work, we used THz time-domain spectroscopy (THz-TDS) to measure the optical conductance of Bi_2Se_3, revealing metallic behavior at temperatures below 50 K. We measure the THz conductance of Bi_2Se_3 as 10 e~2/h at 4 K, indicative of a surface dominated response. Furthermore, the THz conductance spectra reveal characteristic features at ~1.9 THz attributed to the optical phonon mode, which is weakly visible at low temperatures but which becomes more prominent with increasing temperature. These results present a first look at the temperature-dependent behavior of TSSs in Bi_2Se_3 and the capability to selectively identify and address them using THz spectroscopy.
机译:我们已经测量了23倍五倍硒化铋(Bi_2Se_3)的五层厚薄膜的太赫兹(THz)电导,并发现了低于50 K的拓扑表面态(TSSs)的特征。我们提供了拓扑相变与晶格温度的函数关系的证据通过光学手段。在这项工作中,我们使用THz时域光谱(THz-TDS)测量Bi_2Se_3的光学电导,揭示了在低于50 K的温度下的金属行为。我们在4 K下测量Bi_2Se_3的THz电导为10 e〜2 / h。 ,表示表面主导的响应。此外,太赫兹电导光谱揭示了归因于光学声子模式的〜1.9太赫兹的特征,该特征在低温下较弱,但随温度升高而变得更加突出。这些结果首先展示了Bi_2Se_3中TSS的温度依赖性行为,以及使用THz光谱法选择性识别和处理它们的能力。

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