首页> 外文会议>Symposium on Thermoelectric Materials 2001―Research and Applications, Nov 26-29, 2001, Boston, Massachusetts, U.S.A. >Temperature and Thickness Dependences of Thermoelectric Properties of PbS/EuS Bilayers
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Temperature and Thickness Dependences of Thermoelectric Properties of PbS/EuS Bilayers

机译:PbS / EuS双层热电性能的温度和厚度依赖性

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摘要

A non-monotonic character of the dependences of the thermoelectric properties of PbS/EuS/(001)KCl heterostructures on the PbS layer thickness d(d = 2 ― 200 nm) was detected. Pronounced extrema at d ~ 15 nm and less distinct extrema at d ~ 30 nm and d ~ 100 nm were observed. It is suggested that the complex character of the dependences is caused by the competition between percolation phenomena and size quantization. The critical exponent for the electrical conductivity (t= 1.6 +- 0.15) is determined.
机译:检测到PbS / EuS /(001)KCl异质结构的热电特性对PbS层厚度d(d = 2〜200 nm)的依赖性的非单调特性。在d〜15 nm处有明显的极值,而在d〜30 nm和d〜100 nm处则没有明显的极值。建议依赖关系的复杂性是由渗滤现象和大小量化之间的竞争引起的。确定了电导率的临界指数(t = 1.6±0.15)。

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