首页> 外文会议>Symposium on Compound Semiconductor Photovoltaics; 20030422-20030425; San Francisco,CA; US >High-Quality Transparent Conducting Oxide Films Deposited by a Novel Ion Plating Technique
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High-Quality Transparent Conducting Oxide Films Deposited by a Novel Ion Plating Technique

机译:通过新型离子镀技术沉积高质量透明导电氧化物膜

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摘要

A novel ion plating technique that has the attributes of both superb controllability of the high density plasma used as well as ion beam shape has been developed and applied to the deposition of transparent conducting oxides. The advantages of this technique include reduced ion damage, scale-up capability, in-plane uniformity, the use of low growth temperatures and fast deposition rates suggesting that the technique is very promising for a variety of applications such as solar cells and organic device fabrication. Gallium doped zinc oxide films have been deposited on glass substrates at 200℃. Resistivities as low as ρ~2.7x10~(-4) Ω-cm with high transparency have been demonstrated. In addition, this technique has been successfully applied to large area deposition such as 65 cm x 55 cm-sized glass substrates.
机译:已经开发出具有兼具所使用的高密度等离子体的极好的可控制性和离子束形状的特性的新颖的离子镀技术,并将其应用于透明导电氧化物的沉积。该技术的优点包括减少离子损伤,扩大规模的能力,面内均匀性,使用低生长温度和快速沉积速率,这表明该技术对于多种应用(例如太阳能电池和有机器件制造)非常有希望。镓掺杂的氧化锌膜已在200℃的玻璃基板上沉积。电阻率低至ρ〜2.7x10〜(-4)Ω-cm,透明度高。此外,该技术已成功应用于大面积沉积,例如65 cm x 55 cm尺寸的玻璃基板。

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