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Direct Observation of XRD Redox Processes In Tmo's

机译:在Tmo中直接观察XRD氧化还原过程

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Accurate XRD, often in combination with ND, has long been used ot study electron denisty features in crystalien compouns .THe method is particularly succcessful for lightatom systems in which the valence-to-core electron ratio is high. The same method is clearly applciable to the study of lithium insertion/extraction porcesses in TMO compounds; the greatest hinder has been the availability of sufficiently large single crystals, which do not then disintegrae into micron-size particles during the reaction. The case of V_6O_13 is especially advantatgeous in this context, howwever: millimeter-size crystals can be grown y CVT methods, which do not then exhibit severe cracking on lithium insertion, probably as a result of the layer-like natue of the structure. A sequence of single-crystal phases have now been studied in this way folowing in situ electrochemical synthesis in the copostie cathode of a
  • half-cell. The resulting structures have been solved, and their associated electron-density distributions carefully analysed byso-caled Hirshfeld deformation electron density refinement. The method would appear to provide meningful information relating to oxidation state changes occurring on lithium-ion insertion.
  • 机译:长期以来,精确的XRD(通常与ND结合)一直用于研究结晶成分中的电子密度特征。该方法特别适用于价原子核比高的光原子体系。显然,该方法适用于TMO化合物中锂插入/萃取过程的研究。最大的障碍是获得足够大的单晶,它们在反应过程中不会崩解成微米大小的颗粒。但是,在这种情况下,V_6O_13的情况尤其有利:通过CVT方法可以生长毫米级晶体,这可能不会由于结构的层状晶态而在锂插入时表现出严重的裂纹。现在已经以这种方式研究了一系列单晶相,以便在
  • 半电池的共位阴极中进行原位电化学合成。解决了所得结构,并通过按比例的Hirshfeld形变电子密度细化仔细分析了它们的相关电子密度分布。该方法似乎提供了与锂离子插入时发生的氧化态变化有关的有益信息。
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