首页> 外文会议>Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International >A 144GHz 0.76cm-resolution sub-carrier SAR phase radar for 3D imaging in 65nm CMOS
【24h】

A 144GHz 0.76cm-resolution sub-carrier SAR phase radar for 3D imaging in 65nm CMOS

机译:用于6.5nm CMOS的3D成像的144GHz 0.76cm分辨率子载波SAR相位雷达

获取原文
获取原文并翻译 | 示例

摘要

Millimeter-Wave-based radar has gained attention in recent years for automotive and object detection applications. Several new applications are also emerging which employ mm-Wave radar techniques to construct short range mm-Wave 3D imaging systems for security screening and biomedical applications. At present, these types of 3D mm-Wave imagers have only been demonstrated in lll-V technology, as CMOS-based radar suffers several range and resolution limitations due to limited output power and linearity.Most CMOS mm-Wave radar systems used in automotive applications are based on Frequency-Modulated Continuous-Wave (FMCW) ranging techniques in which the carrier is swept to produce a frequency offset at the receiver output proportional to the round-trip distance between the radar and target. While FMCW is an excellent approach for accurate ranging, its implementation becomes particularly difficult at high frequencies as the resolution is heavily dependent on sweep linearity and the high RF front-end performance required to support the wideband swept carrier. For 3D mm-Wave imaging applications, this high operating frequency is indispensable as the attainable spatial (XY) resolution is fundamentally limited by the wavelength of the imaging system. Higher frequency also helps relax focusing lens requirements, as the optical diffraction limit is set by the ratio of the radar wavelength over the lens aperture size.
机译:近年来,基于毫米波的雷达已在汽车和物体检测应用中引起关注。也出现了一些新的应用,这些应用采用毫米波雷达技术来构建用于安全检查和生物医学应用的短距离毫米波3D成像系统。目前,由于基于CMOS的雷达由于有限的输出功率和线性度而受到多种范围和分辨率的限制,因此仅在ll-V技术中证明了这些类型的3D毫米波成像仪。这些应用基于调频连续波(FMCW)测距技术,其中,对载波进行扫频以在接收机输出端产生与雷达和目标之间的往返距离成比例的频率偏移。虽然FMCW是一种用于精确测距的出色方法,但其实现在高频下尤其困难,因为分辨率在很大程度上取决于扫描线性度和支持宽带扫频载波所需的高RF前端性能。对于3D mm-Wave成像应用,此高工作频率是必不可少的,因为可获得的空间(XY)分辨率基本上受成像系统波长的限制。更高的频率还有助于放宽对聚焦透镜的要求,因为光学衍射极限是由雷达波长与透镜孔径尺寸之比设定的。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号