Micro- And Nano-structural Characterization Of Bone/dental Implant Interfaces By Cross-sectional Focused Ion Beam Methods, Scanning Electron Microscopy And Transmission Electron Microscopy

摘要

FIB, SEM, and TEM methods were used to show that osseoin-tegration occurs at the nano-scale level and chemical interdiffusion exists at the interface of the bone/dental implant used in this study.