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On Faulting in Nanocrystallites of FCC Metals

机译:关于FCC金属纳米微晶的断层

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摘要

Patterns calculated by applying the Debye function to faulted spherical nanoparticles are used to test the accuracy of modern Line Profile Analysis theory of faulting for small crystallites. The relative deviation of the determined fault density is found to be dependent on the fault position, and on the particle size. The study of the average pattern from systems of 100 particles (D = 9.8nm) shows an overestimated deviation of the determined fault density by as much as 30%.
机译:通过将Debye函数应用于有缺陷的球形纳米颗粒而计算出的图案用于测试现代线轮廓分析理论对小晶粒的缺陷的准确性。发现确定的断层密度的相对偏差取决于断层位置和颗粒尺寸。对100个粒子(D = 9.8nm)的系统的平均模式进行的研究表明,所确定的断层密度高估了30%。

著录项

  • 来源
    《Residual stresses VIII》|2010年|p.13-18|共6页
  • 会议地点 Riva del Garda(IT);Riva del Garda(IT)
  • 作者单位

    Department of Materials Engineering and Industrial Technologies, University of Trento, 77 Messiano, Trento, TN, 38123, Italy Materials Science and Engineering, Georgia Institute of Technology, 771 Ferst Dr., Atlanta, GA 30332, USA;

    Department of Materials Engineering and Industrial Technologies, University of Trento, 77 Messiano, Trento, TN, 38123, Italy;

    Materials Science and Engineering, Georgia Institute of Technology, 771 Ferst Dr., Atlanta, GA 30332, USA;

    Department of Materials Engineering and Industrial Technologies, University of Trento, 77 Messiano, Trento, TN, 38123, Italy;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料试验;
  • 关键词

    X-Ray Powder Diffraction; Line Profile Analysis; Debye Function; Faulting;

    机译:X射线粉末衍射;线轮廓分析;德拜功能;断层;

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