Thales Optronique, 2 avenue Gay Lussac, 78990, Elancourt, France;
Universite de Lorraine, Institut Elie Cartan de Lorraine, Metz, 57045, France;
SISPIA, 18 allee Henri Dunant, 94300 Vincennes, France;
SISPIA, 18 allee Henri Dunant, 94300 Vincennes, France;
Radon transform; Reflective tomography; FDK algorithm; Maximum Intensity Projection; 3D imaging; Laser imaging; concealed object identification;
机译:封闭电介质盒中隐藏的3D PEC对象重构的散射和图像模拟
机译:封闭电介质盒中隐藏的3D PEC对象重构的散射和图像模拟
机译:从显示的2D横截面图像中可视化3D对象
机译:光学3D成像和隐藏物体的可视化
机译:3D对象检测,实例分段和3D范围和2D彩色图像的分类
机译:从2D横截面图像可视化3D对象显示出原位与前utu
机译:用于隐藏物体检测技术的220GHz宽带3D成像雷达和现象学研究