Ceramic packaging reliability study of a 13.5 kV multichip thyristor

摘要

We present our work on the reliability of the new ceramic housing of our 13.5 kV multichip thyristor. First ceramic versions manifested terrible failure after only a few shots under a bias voltage of 10 kV and a peak current of 110 kA in the best case. This problem has been solved and the newer ceramic-housing version is now fully commercialized under the model number 5SPB36Z1350. This product version completes successfully a stress test of 200 shots under previous conditions without failing. Moreover, no aging behavior has been detected.