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Analysis of Photoluminesencce Efficiency of Annealed GaInNAs Quantum Well Grown by Solid Source Molecular Beam Epitaxy

机译:固体源分子束外延生长退火GaInNAs量子阱的光致发光效率分析

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The carrier dynamics of a 7.5 nm GaInNAs quantum well (QW) are studied by photoluminescence (PL) at a low temperature regime of 4 K to 150 K. The PL emission efficiency of the QW is initially evaluated to examine the recombination mechanisms in the QW. A dual-activation-energy model is later found to fit the integrated PL intensity vs. temperature curve better than a single-activation-energy model. The two states that correspond to the above activation energies could have resulted in a much faster PL intensity quenching in the GaInNAs QW as compared to that of a reference GaInAs QW. One of the states is identified as a localized state that traps carriers at a low temperature range of less than ~100 K. The other state has a larger quenching effect at temperatures higher than 100 K and this state is not studied in this paper. By fitting the original PL spectra with two Gaussian functions, the temperature dependent PL integrated intensity of both Gaussian functions was also studied to further characterize the GaInNAs QW. The analysis gives evidence of the localization behaviour in this QW.
机译:通过在4 K至150 K的低温条件下的光致发光(PL)研究了7.5 nm GaInNAs量子阱(QW)的载流子动力学。初步评估了QW的PL发射效率以检查QW中的重组机制。后来发现,双激活能量模型比单激活能量模型更好地拟合了积分PL强度与温度的关系曲线。与参考GaInAs QW相比,对应于上述活化能的两个状态可能导致GaInNAs QW中PL强度猝灭快得多。其中一种状态被认为是局部状态,在低于100 K的低温范围内会俘获载流子。另一种状态在100 K以上的温度下具有更大的猝灭效果,因此本文不对其进行研究。通过用两个高斯函数拟合原始PL谱,还研究了两个高斯函数的温度相关PL积分强度,以进一步表征GaInNAs QW。分析提供了此QW中定位行为的证据。

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