Investigation of grain boundaries and interfaces in thin films of metal oxide electronic materials by means of HRTEM - A key link of interface engineering in electronic application

摘要

In many cases, the grain boundaries and interfaces are the key elements in electroceramics-based devices and determine the behavior of the electronic devices. In order to obtain the desired properties of the devices engineering of grain boundaries and interfaces is necessary. This needs the knowledge of the structural and chemical details of the interfaces and grain boundaries.