Department of Electrical and Computer Engineering, University of Massachusetts Amherst, Amherst, USA;
Department of Electrical and Computer Engineering, University of Massachusetts Amherst, Amherst, USA;
Department of Electrical and Computer Engineering, University of Massachusetts Amherst, Amherst, USA;
Department of Electrical and Computer Engineering, University of Massachusetts Amherst, Amherst, USA;
Integrated circuit reliability; Error analysis; Standards; Transistors; Thermal noise; Inverters;
机译:利用电压偏置技术调整SRAM单元的大小,以增强存储器和PUF功能的可靠性?
机译:通过电路级技术和差错控制编码提高非易失性存储技术的可靠性
机译:增强的内置自修复技术,可提高嵌入式存储器的制造良率和可靠性
机译:通过电路技术提高弱PUFS的可靠性来增强不匹配
机译:SRAM电路中的功率效率和可靠性增强技术
机译:改善闭合性Pala裂和口鼻瘘的背带齿舌瓣的可靠性和可预测性的技术
机译:采用电压偏置技术确定sRam单元的大小,增强存储器和pUF功能的可靠性