Numerical analysis on transient space charge distribution in XLPE

摘要

The numerical analysis was made on the time variation of space-charge distribution in hot pressed two-layer XLPE samples, especially on the homo space charge accumulation at the internal interface which have been measured by PEA method by Li and Takada, and has been given on explanation so far. The simulation was made by changing the conductivity at hot pressed interface and the carrier injections from the electrodes in transient state. From the simulation, the homo-space charge accumulation at internal interface could be explained by both higher conductivity at internal interface and the existence of carrier injection from the electrode. The hot pressed XLPE molding interface seems to have higher conductivity compared with other part.