Fundamental approach to the storage of energy in dielectrics

摘要

Due to the electromechanical energy stored round a trapped charge, molecular damage can be produced at a macroscopic level by the detrapping of a space charge. This mechanism has been proposed to be the initiation phase of breakdown in MOS capacitors [8] and high voltage capacitors as well [9]. In both cases two distinct processes have been described : (i) one is the sudden destabilisation of big amount of electrons, (ii) the other results from the flowing of electrons successively trapped and detrapped in the dielectric gap. when they are subjected to a high electric field.